|Title||Adsorption Properties of Porous Silicon Characterized by Optically Enhanced Xe-129 Nmr-Spectroscopy|
|Publication Type||Journal Article|
|Year of Publication||1995|
|Authors||Pietrass T., Bifone A., Pines A|
|Date Published||Jul 10|
Highly spin polarized xenon is used to study the adsorption properties of porous silicon surfaces by Xe-129 NMR spectroscopy. The sensitivity enhancement through optical pumping allows the NMR characterization of small amounts of physisorbed xenon in a pressure regime typical for adsorption isotherms. Fully hydrogen terminated porous silicon, porous silicon with an increased number of dangling bonds and porous silicon after methanol adsorption are characterized by the adsorbed Xe-129 NMR lineshape, chemical shift and relaxation behavior.
|URL||<Go to ISI>://WOS:A1995RK97300007|
|Short Title||Adsorption Properties of Porous Silicon Characterized by Optically Enhanced Xe-129 Nmr-Spectroscopy|