Si-29 high resolution solid state nuclear magnetic resonance spectroscopy of porous silicon

TitleSi-29 high resolution solid state nuclear magnetic resonance spectroscopy of porous silicon
Publication TypeJournal Article
Year of Publication1996
AuthorsPietrass T., Bifone A., Roth R.D, Koch V.P, Alivisatos A.P, Pines A
JournalJournal of Non-Crystalline Solids
Volume202
Issue1-2
Pagination68-76
Date PublishedJul
ISBN Number0022-3093
Accession NumberWOS:A1996VE40600008
Keywordsdipolar
Abstract

Porous silicon has been characterized by Si-29 nuclear magnetic resonance spectroscopy under conditions of static samples, magic angle spinning, decoupling and cross polarization. In a free induction decay experiment, two Si-29 resonances at -80 and -111 ppm were obtained. Cross polarization resulted in a single resonance at -97 ppm. Magic angle spinning and decoupling slightly reduce the linewidth of the Si-29 cross polarized signal, The minor narrowing effect and thr relaxation behavior in the laboratory and rotating frame indicate a homogeneous contribution to the linewidth. The relaxation data suggest that the resonance observed under cross polarization conditions arises from SiH or SiH2 structural elements.

URL<Go to ISI>://WOS:A1996VE40600008
DOI10.1016/0022-3093(96)00144-5
Short TitleSi-29 high resolution solid state nuclear magnetic resonance spectroscopy of porous silicon
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